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激光共聚焦荧光成像系统 & FLIM

激光共聚焦荧光成像系统 & FLIM

基于激光共焦扫描显微系统:  检测波长标准配置范围:350-1050nm;寿命范围100ps-100ms;用于化学、纳米、能源、生物等学科方向,单分子动态、活细胞、微区成像及形貌、能级结构和能量传递特征的机理研究。 主要功能描述:激光共焦荧光强度成像LCM;荧光寿命成像FLIM,磷光寿命成像PLIM;上转换荧光(寿命)成像,稀土发光(寿命)成像,延迟荧光(寿命)成像;荧光波动成像FFS/FCS.
用于单分子检测的定量细胞生物学仪器。 受激发射损耗(STED)是一种功能强大的显微镜技术,可用于观察空间分辨率低于衍射极限的荧光结构。Alba STED使用脉冲激发和脉冲耗尽方法(pSTED)结合数字频域荧光寿命成像(FastFLIM)记录时间分辨光子,从而提高图像分辨率并分离具有相同激发波长的两个荧光标记物。
Within the past few years, several methods have been devised in order to obtain images with nanometer resolution of cellular features using an optical microscope (STED, PALM, STORM). Although powerful, these methods are quite inefficient when detecting sparse nanostructures in an image. Also they are inadequate to detect the dynamics of chemical reactions which occur in the sub-second time scale in nanometer-size 3D structures, which are continuously moving and changing shape.
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